au.\*:("MAZUR, R. G")
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Carrier diffusion effects in III-V semiconductor structures measured by the point contact current voltage techniqueELDRIDGE, G. W; BERKOWITZ, H. L; HILLARD, R. J et al.Journal of vacuum science and technology. B. Microelectronics processing and phenomena. 1992, Vol 10, Num 1, pp 463-467, issn 0734-211XConference Paper
Optimization of the spreding resistance profiling technique for submicron structuresBERKOWITZ, H. L; BURNELL, D. M; HILLARD, R. J et al.Solid-state electronics. 1990, Vol 33, Num 6, pp 773-781, issn 0038-1101, 9 p.Article